Tag: #Burn-in-testing (BIT)

Introduction: Failure-Oriented-Accelerated-Testing (FOAT) is a critical approach to enhancing electronics reliability by identifying potential failures at the design stage. This method complements conventional qualification and burn-in testing, ensuring that electronic components meet high reliability standards for industries such as aerospace, military, and telecommunications. Visit https://www.physicsresjournal.org/ijpra/about for more groundbreaking research in this field. Understanding FOAT and…